The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2020

Filed:

Jan. 27, 2017
Applicant:

Hp Indigo B.v., Amstelveen, NL;

Inventors:

Meir Grinstein, Ness Ziona, IL;

Asaf Shoshani, Ness Ziona, IL;

Sharon Elbaz, Ness Ziona, IL;

Assignee:

HP Indigo B.V., Amstelveen, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G 15/00 (2006.01); G03G 15/02 (2006.01); G03G 21/16 (2006.01);
U.S. Cl.
CPC ...
G03G 15/5037 (2013.01); G03G 15/0266 (2013.01); G03G 21/1647 (2013.01); G03G 2221/1654 (2013.01);
Abstract

In an example, a method includes charging a photoconductive surface in a print apparatus and monitoring an electrical parameter associated with a proximity of a print apparatus component to the photoconductive surface. A relative spacing between the print apparatus component and the photoconductive surface may be changed and a contact between the print apparatus component and the photoconductive surface may be detected when the electrical parameter meets predetermined criteria.


Find Patent Forward Citations

Grinstein, Meir. (2020). Detecting contact between print apparatus components and photoconductive surfaces (U.S. Patent No. 10627760). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10627760

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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