The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2020
Filed:
Jun. 17, 2019
Applicants:
Kazuhiro Yoneda, Osaka, JP;
Yoshihiko Miki, Kyoto, JP;
Naoki Fukuoka, Osaka, JP;
Inventors:
Assignee:
Ricoh Company, Ltd., Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03B 1/20 (2006.01); G03B 1/56 (2006.01); H04N 9/31 (2006.01); G02B 27/48 (2006.01); G03B 21/625 (2014.01); G03B 21/62 (2014.01); G03B 21/58 (2014.01); G03B 21/60 (2014.01); G03B 21/20 (2006.01); G03B 21/56 (2006.01);
U.S. Cl.
CPC ...
G03B 21/2033 (2013.01); G02B 27/48 (2013.01); G03B 21/56 (2013.01); G03B 21/58 (2013.01); G03B 21/60 (2013.01); G03B 21/62 (2013.01); G03B 21/625 (2013.01); H04N 9/3129 (2013.01);
Abstract
There is provided an improved light source including a plurality of light emitting elements in a surface. An arrangement of the plurality of light emitting elements fulfills, in an assumed projection area, an element interval at which irradiation light beams of the plurality of light emitting elements overlaps, and fulfills an element interval at which a speckle pattern of each of the irradiation light beams obtained in the assumed projection area is different for each of the irradiation light beams.