The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2020

Filed:

May. 15, 2019
Applicant:

Jvc Kenwood Corporation, Yokohama-shi, Kanagawa, JP;

Inventors:

Masayuki Ono, Yokohama, JP;

Shingo Yagyu, Yokohama, JP;

Makoto Itonaga, Yokohama, JP;

Yuichi Hasegawa, Yokohama, JP;

Koji Tsujita, Yokohama, JP;

Assignee:

JVC KENWOOD CORPORATION, Yokohama-Shi, Kanagawa, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/14 (2006.01); G01N 33/543 (2006.01); G01N 15/06 (2006.01); G01N 15/00 (2006.01);
U.S. Cl.
CPC ...
G01N 33/54366 (2013.01); G01N 15/0612 (2013.01); G01N 15/1429 (2013.01); G01N 15/1434 (2013.01); G01N 15/1456 (2013.01); G01N 33/543 (2013.01); G01N 2015/0038 (2013.01); G01N 2015/0065 (2013.01); G01N 2015/1486 (2013.01);
Abstract

An analysis device optically scans a surface of a substrate to which particles are fixed, detects a pulse wave included in a detection signal obtained from an optical scanning unit when the optical scanning unit scans the substrate, and counts the particles based on pulse interval between two pulse waves each having pulse width less than first reference value determined depending on first pulse width when the optical scanning unit scans a plurality of particles adjacent to each other when the two pulse waves are detected consecutively.


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