The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2020
Filed:
Aug. 28, 2018
Shimadzu Corporation, Kyoto-shi, Kyoto, JP;
Tetsuya Nagai, Kyoto, JP;
SHIMADZU CORPORATION, Kyoto, JP;
Abstract
Provided are a refractive index measuring device and a refractive index measuring method. A detector () detects an intensity of a measuring beam transmitted through the sample. A camera () images a color image of the measuring beam which is dispersed into multiple colors by transmitting through the sample. A scanning processing portion () carries out scanning by changing an angle of receiving the measuring beam transmitted through the sample or an angle of the measuring beam incident on the sample. A wavelength specifying processing portion () specifies, based on the detected intensity of the detector () varying with the scanning by the scanning processing portion () and color information corresponding to a position of the measuring beam incident on the detector () in a color image which is imaged by the camera (), the wavelength corresponding to each peak of the detected intensity.