The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2020
Filed:
Apr. 04, 2016
Applicant:
Jp3 Measurement, Llc, Austin, TX (US);
Inventors:
Assignee:
JP3 Measurement, LLC, Austin, TX (US);
Primary Examiner:
Int. Cl.
CPC ...
G01F 17/00 (2006.01); G01N 21/359 (2014.01); G06F 16/583 (2019.01); G06F 16/2457 (2019.01); G01N 33/22 (2006.01); G01N 33/28 (2006.01);
U.S. Cl.
CPC ...
G01N 21/359 (2013.01); G01N 33/225 (2013.01); G01N 33/28 (2013.01); G06F 16/24575 (2019.01); G06F 16/5838 (2019.01); G01N 2201/10 (2013.01); G01N 2201/12 (2013.01); G01N 2201/129 (2013.01); G01N 2201/13 (2013.01);
Abstract
An improved method and system for analyzing multistate fluids using NIR spectroscopy. If the sample to be tested resides in a single state condition, the configuration file used in spectroscopic analysis will only be applied against a single model. However, if the sample to be tested is in a multi-state environment, an algorithm determines which model set of a plurality of model sets should be utilized based on the sample characteristics, and the configuration file used in spectroscopic analysis will be applied against the selected model. Results are generated showing the designated parameters.