The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2020

Filed:

Oct. 19, 2018
Applicant:

Kaiser Optical Systems Inc., Ann Arbor, MI (US);

Inventor:

Patrick Wiegand, Pinckney, MI (US);

Assignee:

Kaiser Optical Systems Inc., Ann Arbor, MI (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/44 (2006.01); G01J 3/18 (2006.01); G01N 21/65 (2006.01);
U.S. Cl.
CPC ...
G01J 3/4412 (2013.01); G01J 3/1838 (2013.01); G01N 21/65 (2013.01); G01N 2201/121 (2013.01);
Abstract

An improved method for integrating curve peaks as compared to techniques such as the trapezoidal rule wherein integration parameters are at fixed x-axis positions. Integration parameters are instead specified relative to a peak center, which allows the peak to shift over time due to hardware changes, temperature fluctuation, pressure changes, etc., while maintaining integration parameters at optimal locations for that peak. As such, the present disclosure finds particular utility in spectroscopy wherein, in the case of Raman spectroscopy, for example, specific wavenumber shift locations may drift over time, leading to inaccurate results based upon absolute integration parameters.


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