The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2020

Filed:

Sep. 16, 2016
Applicants:

Centre National DE LA Recherche Scientifique, Paris, FR;

Université D'aix-marseille, Marseilles, FR;

Inventors:

Myriam Zerrad, Marseilles, FR;

Michel Lequime, Gardanne, FR;

Claude Amra, Marseilles, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/30 (2006.01); G01N 21/47 (2006.01); G01N 21/59 (2006.01); G01N 21/88 (2006.01); G02B 5/28 (2006.01); G01N 21/85 (2006.01);
U.S. Cl.
CPC ...
G01B 11/30 (2013.01); G01N 21/4738 (2013.01); G01N 21/59 (2013.01); G01N 21/85 (2013.01); G01N 21/8806 (2013.01); G02B 5/285 (2013.01);
Abstract

The invention relates to an optical device for characterization of a sample () comprising —a source () of parallel or collimated light, having an emission spectrum that is continuous over an observation wavelength range of at least 50 nm width, for illuminating the sample (), —a detector () of light scattered by the sample (), operating in said observation wavelength range, —a filter () for specific spectral weighting arranged on an optical path upstream of the detector () of the scattered light, and —a processing unit () for processing the measurement signal in order to extract a characterization parameter of the sample ().


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