The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2020
Filed:
Jan. 30, 2019
Samsung Display Co., Ltd., Yongin-si, Gyeonggi-do, KR;
Jae Woo Lee, Yongin-si, KR;
Samsung Display Co., Ltd., Yongin-si, KR;
Abstract
An alignment inspection apparatus and a lamination inspection system are provided. An alignment inspection apparatus includes: a camera configured to photograph an alignment between an upper plate and a lower plate which are laminated to generate image data of the alignment; an alignment calculator configured to calculate horizontal distances and vertical distances in a non-overlapping area where the upper plate and the lower plate do not overlap with each other using the image data to generate alignment data; and a misalignment detector configured to detect true defect data in which noise data is filtered using the horizontal distances and the vertical distances.