The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2020

Filed:

Jan. 11, 2019
Applicant:

Keyence Corporation, Osaka, JP;

Inventors:

Hajime Matsuda, Osaka, JP;

Masashi Nakao, Osaka, JP;

Assignee:

Keyence Corporation, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/06 (2006.01); G01B 11/25 (2006.01); G01N 21/956 (2006.01); G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
G01B 11/0608 (2013.01); G01B 11/25 (2013.01); G01N 21/8851 (2013.01); G01N 21/95607 (2013.01); G01N 2021/8887 (2013.01);
Abstract

Based on a plurality of first pattern images, a first angle image with each pixel having irradiation angle information of first measuring pattern lights on the measurement object is generated, and based on a plurality of second pattern images, a second angle image with each pixel having irradiation angle information of second measuring pattern lights on the measurement object is generated. In accordance with the irradiation angle information of each pixel in the first angle image, the irradiation angle information of each pixel in the second angle image, and relative position information of a first light projection unit and a second light projection unit, the height of the measurement object in a direction of a central axis of a lighting device is measured.


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