The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2020
Filed:
Apr. 18, 2017
Applicant:
Kabushiki Kaisha Topcon, Tokyo, JP;
Inventors:
Jonathan J. Liu, New York, NY (US);
Zhenguo Wang, Ridgewood, NJ (US);
Jongsik Kim, Fort Lee, NJ (US);
Kinpui Chan, Ridgewood, NJ (US);
Assignee:
KABUSHIKI KAISHA TOPCON, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02091 (2013.01); G01B 9/02069 (2013.01); G01B 9/02071 (2013.01); G01B 2290/60 (2013.01);
Abstract
A reference signal having a known induced optical delay is used for phase stabilization of optical coherence tomography (OCT) interferograms, and for correcting sampling differences within OCT interferograms, in single mode and multimodal OCT systems. The reference signal can then be used to the measure time shift or sample clock period shifts induced in the interferogram signal by the OCT system. A corresponding OCT interferogram signal can then be corrected to remove the shift induced by the system based on the determination.