The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2020

Filed:

Mar. 17, 2017
Applicant:

Shima Seiki Mfg., Ltd., Wakayama, JP;

Inventors:

Koichi Terai, Wakayama, JP;

Koji Takeda, Wakayama, JP;

Takenori Takatsuka, Wakayama, JP;

Takahiro Aoki, Wakayama, JP;

Assignee:

Shima Seiki Mfg., Ltd., Wakayama, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
D04B 35/00 (2006.01); D04B 37/02 (2006.01);
U.S. Cl.
CPC ...
D04B 35/00 (2013.01); D04B 37/02 (2013.01); D10B 2501/043 (2013.01);
Abstract

Initial pattern data () and gauge data are stored, the pattern data is converted into knitting data based on the gauge data, and a knitted product is test-knitted. Sizes of the test-knitted product are compared with sizes indicated by the initial pattern data (), and the pattern data or the knitting data is corrected. The correction amounts for the pattern data or for knitting data for two sizes are stored, and interpolation or extrapolation is performed based on the stored correction amounts to correct pattern data or knitting data for other sizes.


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