The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2020

Filed:

Dec. 12, 2017
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Mohammad Reza Kakoee, San Diego, CA (US);

Rahul Gulati, San Diego, CA (US);

Eric Mahurin, Austin, TX (US);

Suresh Kumar Venkumahanti, Austin, TX (US);

Dexter Chun, San Diego, CA (US);

Assignee:

Qualcomm Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01); B60W 50/02 (2012.01); H03M 13/05 (2006.01); G06F 11/22 (2006.01); H04L 1/24 (2006.01);
U.S. Cl.
CPC ...
B60W 50/0205 (2013.01); G06F 11/1048 (2013.01); G06F 11/2215 (2013.01); H03M 13/05 (2013.01); H04L 1/24 (2013.01);
Abstract

A system and a method for error-correction code ('ECC') error handling is described herein. In one aspect, the system and method may operate an ECC function on raw data. The ECC function may include generating ECC syndrome data by an ECC syndrome data generating module. The ECC syndrome data may be derived from the raw data. The system and a method may further inject a fault based on the ECC syndrome data or the raw data. The system and a method may further determine whether the ECC error detected by the ECC checker corresponds to a malfunction of the ECC function or the fault injected based on the ECC syndrome data or the raw data.


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