The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2020

Filed:

Jun. 22, 2017
Applicant:

Asahi Kasei Kabushiki Kaisha, Tokyo, JP;

Inventors:

Saya Maeda, Tokyo, JP;

Akitake Nakamura, Tokyo, JP;

Takayuki Akaogi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B01D 53/04 (2006.01); B01J 20/18 (2006.01); C01B 39/48 (2006.01); B01J 20/34 (2006.01); B01D 53/26 (2006.01); B01D 53/02 (2006.01); B01D 53/28 (2006.01); B01J 20/30 (2006.01);
U.S. Cl.
CPC ...
B01J 20/18 (2013.01); B01D 53/02 (2013.01); B01D 53/04 (2013.01); B01D 53/261 (2013.01); B01D 53/28 (2013.01); B01J 20/3057 (2013.01); B01J 20/3078 (2013.01); B01J 20/3085 (2013.01); B01J 20/34 (2013.01); C01B 39/48 (2013.01); B01D 2253/1085 (2013.01); B01D 2256/245 (2013.01); B01D 2257/504 (2013.01); B01D 2257/80 (2013.01);
Abstract

An MWF-type zeolite, wherein, when the heights of peaks around 2θ=11.1 and 13.8° in a peak obtained by X-ray diffraction are defined as A and B, respectively, 0.63≤B/A≤0.80 satisfied.


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