The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2020

Filed:

Jul. 25, 2017
Applicant:

Sensor Electronic Technology, Inc., Columbia, SC (US);

Inventors:

Alexander Dobrinsky, Loudonville, NY (US);

Michael Shur, Latham, NY (US);

Arthur Peter Barber, III, Columbia, SC (US);

Maxim S. Shatalov, Columbia, SC (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
F26B 3/34 (2006.01); A61L 2/10 (2006.01); A61L 9/20 (2006.01); C12N 1/14 (2006.01); A61L 2/00 (2006.01);
U.S. Cl.
CPC ...
A61L 2/10 (2013.01); A61L 9/20 (2013.01); C12N 1/14 (2013.01); A61L 2/00 (2013.01); A61L 2202/14 (2013.01); A61L 2209/111 (2013.01); Y02P 60/146 (2015.11);
Abstract

A solution for controlling mildew in a cultivated area is described. The solution can include a set of ultraviolet sources that are configured to emit ultraviolet radiation in an ultraviolet range of approximately 260 nanometers to approximately 310 nanometers to harm mildew present on a plant or ground surface. A set of sensors can be utilized to acquire plant data for at least one plant surface of a plant, which can be processed to determine a presence of mildew on the at least one plant surface. Additional features can be included to further affect the growth environment for the plant. A feedback process can be implemented to improve one or more aspects of the growth environment.


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