The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2020
Filed:
Mar. 02, 2015
Moeller-wedel Gmbh, Wedel, DE;
Martin Schmidt, Bad Schwartau, DE;
Jochen Koetke, Hamburg, DE;
Peter Schalt, Moorrege, DE;
Stefan Oelkers, Berlin, DE;
Rolf-Rainer Grigat, Halstenbek, DE;
Thomas Hoell, Buehl, DE;
Moeller-Wedel GmbH, Wedel, DE;
Abstract
An operating microscope including an optical unit for forming an image of an object plane in oculars of the microscope, an optoelectronic image receiver coupled to the microscope and optics to form images, of objects placed in a region between a front objective of the microscope and an object plane of the microscope, on the optoelectronic image receiver. The microscope has a magnification factor of the optics to form images, and a system to detect optical markings forming a markings pattern placed on a surgical instrument or an object placed in the region between the front objective of the microscope and the object plane of the microscope. The system calculates a geometrical position and orientation of the markings pattern in relation to the optoelectronic image receiver, relative to the microscope.