The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2020
Filed:
Mar. 17, 2017
Uurmi Systems Pvt Ltd, Telangana, IN;
Vivek Akkala, Telangana, IN;
Parth Nayankumar Parikh, Telangana, IN;
Mahesh Kumar B S, Telangana, IN;
Ajinkya S. Deshmukh, Telangana, IN;
Swarup S. Medasani, Telangana, IN;
Other;
Abstract
A method and system for detection of contaminants present on a lens of an imaging device is disclosed. An input image received from an imaging device is split into a plurality of patches of predefined size and a kurtosis value calculated for each and compared with a median kurtosis value. Patches having kurtosis value less than the median kurtosis value are selected. Based on comparison of a first maximum likelihood of the selected patches with a predefined threshold, one or more selected patches are stored. Such patches are split into a top and a bottom portion for processing based on discrete wavelet transform and singular value decomposition, respectively. The top and the bottom portion are merged patches for which a second maximum likelihood is greater than a second predefined threshold, are stored. Further, contaminants in the image are classified into predefined categories based on one or more image features.
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