The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2020
Filed:
Mar. 26, 2018
Fujitsu Optical Components Limited, Kawasaki-shi, Kanagawa, JP;
Tomonori Azuma, Ota, JP;
Kohei Shibata, Isehara, JP;
FUJITSU OPTICAL COMPONENTS LIMITED, Kawasaki, JP;
Abstract
A wavelength monitoring device includes a polarization rotation element; an etalon element that includes a first double refractive layer and a single refractive layer or a second double refractive layer that is disposed by rotating an optic axis of the second double refractive layer with respect to an optic axis of the first double refractive layer; a polarization separating element that separates an input light, which has the polarization direction rotated and is transmitted through the etalon element, into first light having a polarization direction parallel to the optic axis of the first double refractive layer and second light having a polarization direction perpendicular to the optic axis of the first double refractive layer; a first light receiving device that receives the first light to detect a first monitor value; and a second light receiving device that receives the second light to detect a second monitor value.