The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2020

Filed:

Oct. 17, 2017
Applicant:

Semes Co., Ltd., Chungcheongnam-do, KR;

Inventors:

Soon-Cheon Cho, Gyeonggi-do, KR;

Bongkyu Shin, Chungcheongnam-do, KR;

Byeol Han, Gyeonggi-do, KR;

Hyun Joong Kim, Gyeonggi-do, KR;

Assignee:

SEMES CO. LTD., Chungcheongnam-Do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/67 (2006.01); H01L 21/683 (2006.01); B08B 3/10 (2006.01); B08B 7/00 (2006.01); G03F 1/82 (2012.01); H01J 37/32 (2006.01); H01L 21/3065 (2006.01);
U.S. Cl.
CPC ...
H01L 21/67051 (2013.01); B08B 3/10 (2013.01); B08B 7/0057 (2013.01); G03F 1/82 (2013.01); H01J 37/32495 (2013.01); H01J 37/32623 (2013.01); H01L 21/3065 (2013.01); H01L 21/67086 (2013.01); H01L 21/67103 (2013.01); H01L 21/67109 (2013.01); H01L 21/6831 (2013.01);
Abstract

Disclosed are an apparatus and a method for cleaning a component of a substrate dry processing apparatus. The method for cleaning a component of a substrate dry processing apparatus includes dipping the component in a cleaning solution received in a cleaning bath, generating radicals from the cleaning solution, and cleaning the component with the radicals. The component is cleaned with hydrogen radicals (H*) and hydroxyl radicals (OH*) generated from ozone water. Accordingly, it is possible to rapidly remove carbon (C) and fluorine (F) deposited on the component.


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