The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2020

Filed:

Jan. 13, 2017
Applicant:

Toshiba Medical Systems Corporation, Otawara-shi, JP;

Inventors:

Ting Xia, Mundelein, IL (US);

Jian Zhou, Buffalo Grove, IL (US);

Zhou Yu, Wilmette, IL (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 11/00 (2006.01); A61B 6/00 (2006.01); A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
G06T 11/005 (2013.01); A61B 6/032 (2013.01); A61B 6/461 (2013.01); A61B 6/482 (2013.01); A61B 6/5205 (2013.01); A61B 6/5211 (2013.01); A61B 6/5258 (2013.01); A61B 6/582 (2013.01);
Abstract

A method and apparatus is provided to obtain projection data representing an intensity of X-ray radiation detected at a plurality of detector elements after traversing an object, the projection data being corrected for a baseline offset, correct the projection data by performing a positivity mapping to generate corrected projection data, perform a logarithm operation on the corrected projection data to generate post-log projection data, correct for a bias of the post-log projection data, using the projection data, to generate bias-corrected projection data, and reconstruct an image of the object from the bias-corrected projection data.


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