The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2020
Filed:
Mar. 27, 2018
Applejack 199 L.p., San Jose, CA (US);
Wojciech J Walecki, Sunrise, FL (US);
Wei-Chun Hung, San Jose, CA (US);
APPLEJACK 199 L.P., Milpitas, CA (US);
Abstract
The present subject matter at-least provides a system for measurement of topography of specular surfaces. The system comprises a set of indexed light-sources and a controller configured to drive the set of light-sources for irradiating a specular-surface by sequentially illuminating a plurality of sub-sets of the light-sources in accordance with a pre-defined encoding criteria. Further, at least one camera is provided to capture reflected light-radiation from the specular-surface and thereby generate a plurality of images in accordance with the sequential-illumination, such that each of the generated-image corresponds to a particular sub-set of illuminated light sources. Further, a processing system is configured to process each generated image in accordance with an image-processing criteria specific to the encoding-criteria to determine one or more index of light-sources and thereby identify the light-sources within the images; and determine topography of the specular-surface at-least based on calculation of spatial-coordinates and the determined identity of each light-source.