The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2020
Filed:
Aug. 19, 2016
International Business Machines Corporation, Armonk, NY (US);
Robert G. Farrell, Cornwall, NY (US);
Oktie Hassanzadeh, Port Chester, NY (US);
Mohammad Sadoghi Hamedani, Chappaqua, NY (US);
Meinolf Sellmann, Cortlandt Manor, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Methods, systems, and computer program products for iterative and targeted feature selection are provided herein. A computer-implemented method includes generating a first prediction value for a variable attribute of a set of objects by executing a predictive model that comprises a set of features for the set of objects; evaluating the prediction error of the predictive model based on said first prediction value; generating additional features upon a determination that the prediction error exceeds a threshold; incorporating the additional features into the predictive model, generating an updated predictive model; generating a second prediction value for the variable attribute by executing the updated predictive model; evaluating the prediction error of the updated predictive model based on said second prediction value; and outputting the second prediction value to a user upon a determination that the prediction error of the updated predictive model is below the threshold.