The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2020

Filed:

Oct. 25, 2017
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-Do, KR;

Inventors:

Hyo-Sig Won, Suwon-si, KR;

Myung-Soo Jang, Seoul, KR;

Hyoun-Soo Park, Seoul, KR;

Da-Yeon Cho, Seongnam-si, KR;

Assignee:

SAMSUNG ELECTRONICS CO., LTD., Suwon-si, Gyeonggi-Do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G03F 1/70 (2012.01); G03F 7/20 (2006.01); G03F 1/76 (2012.01); H01L 21/311 (2006.01); G03F 1/68 (2012.01);
U.S. Cl.
CPC ...
G06F 17/5081 (2013.01); G03F 1/68 (2013.01); G03F 1/70 (2013.01); G03F 1/76 (2013.01); G03F 7/70283 (2013.01); G03F 7/70466 (2013.01); G06F 17/5072 (2013.01); G06F 17/5077 (2013.01); H01L 21/31144 (2013.01); G06F 2217/12 (2013.01);
Abstract

A computer-implemented method includes placing standard cells based on design data defining an integrated circuit. A layout of the integrated circuit is generated by performing colorless routing. First, second, third and fourth patterns included in a quadruple patterning lithography (QPL) layer are arranged, based on space constraints, on the placed standard cells. The generated layout is stored to a computer-readable storage medium. The space constraints define minimum spaces between the first, second, third and fourth patterns. The method includes assigning first, second, third and fourth colors to the first, second, third and fourth patterns, respectively. Masks are generated based on the layout. A semiconductor device is manufactured by using the generated masks. A space between two patterns of the first, second, third and fourth patterns smaller than a corresponding space constraint of the space constraints indicates a color violation.


Find Patent Forward Citations

Loading…