The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2020

Filed:

Aug. 18, 2017
Applicant:

Ca, Inc., New York, NY (US);

Inventor:

John Mathunny, Oakbrook, IL (US);

Assignee:

CA TECHNOLOGIES, INC., New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/78 (2006.01); G06F 16/22 (2019.01); G06F 16/2455 (2019.01); G06F 16/27 (2019.01); G06F 16/901 (2019.01); H04L 29/08 (2006.01);
U.S. Cl.
CPC ...
G06F 16/27 (2019.01); G06F 15/7867 (2013.01); G06F 16/2255 (2019.01); G06F 16/2455 (2019.01); G06F 16/9024 (2019.01); H04L 67/1002 (2013.01); H04L 67/1008 (2013.01); H04L 67/1095 (2013.01); H04L 67/1097 (2013.01); H04L 67/2842 (2013.01); H04L 67/327 (2013.01);
Abstract

Method and systems for data retrieval is provided. A query is received to search for metric data corresponding to a component of a datacenter, the component of the datacenter identified by a metric instance. An index is searched for the metric instance, the index comprising the metric instance synchronously stored in a flattened format. Further, a slot identification corresponding to the metric instance is determined, the slot identification identifying a location of the metric data in an inventory. Based on the determined slot identification, metric data is retrieved from the inventory, the inventory comprising the metric data asynchronously stored in an unflattened format. Additionally, a query result comprising the metric data corresponding to the search is communicated.


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