The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2020

Filed:

Dec. 06, 2016
Applicant:

Huawei Technologies Co., Ltd., Shenzhen, CN;

Inventors:

Shikai Liu, Nanjing, CN;

Jie Feng, Nanjing, CN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/20 (2019.01); G06F 16/22 (2019.01); G06F 16/215 (2019.01); G06F 16/25 (2019.01);
U.S. Cl.
CPC ...
G06F 16/2272 (2019.01); G06F 16/215 (2019.01); G06F 16/254 (2019.01);
Abstract

A data integration method and apparatus, where the method includes sampling a first data source (A) at least twice to obtain a first sample data source (a) and a second sample data source (a'), separately calculating an index of each attribute field of the A, a second data source (B), the a, and the a′, determining a decision value of an attribute field Xof the A according to a difference degree between an index of an attribute field Xof the a and an index of each attribute field Xof the a′, and mapping, to the attribute field Xof the first data source, an attribute field that is of the B and whose index and the attribute field Xof the A have a difference degree less than the decision value.


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