The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2020

Filed:

May. 16, 2017
Applicant:

Sap SE, Walldorf, DE;

Inventors:

Frederik Transier, Heidelberg, DE;

Kai Stammerjohann, Wiesloch, DE;

Nico Bohnsack, Walldorf, DE;

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/22 (2019.01); G06F 16/2455 (2019.01); G06F 16/28 (2019.01);
U.S. Cl.
CPC ...
G06F 16/22 (2019.01); G06F 16/24556 (2019.01); G06F 16/24561 (2019.01); G06F 16/285 (2019.01); G06F 16/287 (2019.01);
Abstract

In one respect, there is provided a method. The method can include processing a first data chunk to generate a first intermediate result. A key map can be generated based on a determination that a quantity of the key-value pairs in the first intermediate result exceeds a threshold. The key map can be generated to include keys in the first intermediate result. A second data chunk can be processed to generate a second intermediate result. The second data chunk can be processed based on the key map. The processing of the second data chunk can include omitting a key-value pair in the second data chunk from being inserted into the second intermediate result based on a key associated with the key-value pair being absent from the key map. A preview of the processing of the dataset can be generated based on the first intermediate result and the second intermediate result.


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