The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2020

Filed:

Jul. 26, 2019
Applicant:

Japan Display Inc., Tokyo, JP;

Inventors:

Takafumi Suzuki, Tokyo, JP;

Shota Hosaka, Tokyo, JP;

Yosuke Nakamori, Tokyo, JP;

Assignee:

Japan Display Inc., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/041 (2006.01); F21V 8/00 (2006.01); G02F 1/1343 (2006.01); G06F 3/044 (2006.01); H01L 27/32 (2006.01); G02F 1/1333 (2006.01); H01L 51/52 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0414 (2013.01); G02B 6/0046 (2013.01); G02B 6/0055 (2013.01); G02F 1/134363 (2013.01); G06F 3/044 (2013.01); G06F 3/0412 (2013.01); G06F 3/0416 (2013.01); H01L 27/323 (2013.01); G02F 1/13338 (2013.01); G02F 2001/134372 (2013.01); G06F 2203/04105 (2013.01); G06F 2203/04108 (2013.01); H01L 51/5206 (2013.01); H01L 51/5221 (2013.01);
Abstract

According to an aspect, a force detection apparatus includes: a first electrode facing an input surface to which an object to be detected applies a force; a second electrode facing the first electrode across a first layer deformable by the force; a conductor facing the second electrode across a second layer deformable by the force; and a force detection controller calculates a force signal value indicating the force, based on a first influence amount and a second influence amount, the first influence amount being an amount of influence added by the force to first capacitance between the first electrode and the second electrode, and the second influence amount being an amount of influence added by the force to second capacitance between the second electrode and the conductor.


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