The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2020
Filed:
May. 16, 2017
Endress + Hauser Gmbh + Co. KG, Maulburg, DE;
Matthias Altendorf, Lorrach, DE;
Marc Baret, Kembs, FR;
ENDRESS+HAUSER SE+CO. KG, Maulberg, DE;
Abstract
An apparatus for determining or monitoring at least one process variable which comprises a sensor element, measuring electronics, at least one control/evaluating/calculating unit arranged removed from the measuring unit and/or an in/output unit arranged removed from the measuring unit and the control/evaluating/calculating unit. The control/evaluating/calculating unit and the in/output unit are connected with the measuring unit via a first interface, respectively a second interface, wherein the measuring electronics operates the sensor element and forwards the measurement signals via the interfaces to the control/evaluating/calculating unit as unprocessed, raw, measured values, and wherein the control/evaluating/calculating unit arranged removed from the measuring unit determines, improves and/or monitors the process variable based on the raw, measured values and makes such available via the in/output unit.