The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2020

Filed:

Nov. 08, 2018
Applicant:

The Regents of the University of California, Oakland, CA (US);

Inventors:

Bo Huang, San Francisco, CA (US);

Ryan McGorty, San Diego, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 5/06 (2006.01); G02B 21/00 (2006.01); G02B 21/16 (2006.01); G02B 21/24 (2006.01); G02B 21/36 (2006.01); G01N 21/64 (2006.01); B01L 3/00 (2006.01); G02B 21/04 (2006.01); G02B 21/06 (2006.01); B01F 5/06 (2006.01); B01F 13/00 (2006.01); B01F 15/04 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0088 (2013.01); B01L 3/5027 (2013.01); B01L 3/502761 (2013.01); G01N 21/6458 (2013.01); G02B 5/06 (2013.01); G02B 21/04 (2013.01); G02B 21/06 (2013.01); G02B 21/16 (2013.01); G02B 21/24 (2013.01); G02B 21/362 (2013.01); G02B 21/367 (2013.01); B01F 5/0647 (2013.01); B01F 13/0059 (2013.01); B01F 15/0404 (2013.01); B01L 2200/0694 (2013.01); B01L 2300/0654 (2013.01); B01L 2300/0883 (2013.01); G01N 21/6452 (2013.01);
Abstract

In one embodiment, a selective plane illumination microscopy system for capturing light emitted by an illuminated specimen, the system including a specimen support having a top surface configured to support a specimen holder and an opening configured to provide access to a bottom of the specimen holder, and a selective plane illumination microscopy optical system positioned beneath the specimen support, the optical system configured to illuminate the specimen with a sheet of excitation light and including an excitation objective, a detection objective, and an open-top, hollow imaging element that is configured to contain a liquid, wherein the imaging element is positioned within the opening of the specimen support and optical axes of the objectives are aligned with the imaging element such that the axes pass through the imaging element and intersect at a position near the top surface of the specimen support.


Find Patent Forward Citations

Quick Actions:

Huang, Bo. (2020). Selective plane illumination microscopy (spim) systems and methods (U.S. Patent No. 10620415). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10620415

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