The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2020
Filed:
Nov. 01, 2017
Hubei University of Technology, Wuhan, Hubei, CN;
Tsinghua University, Beijing, CN;
China Special Equipment Inspection and Research Institute, Beijing, CN;
Eddysun (Xiamen) Electronic Co., Ltd., Xiamen, Fujian, CN;
Huazhong University of Science and Technology, Wuhan, Hubei, CN;
Songling Huang, Beijing, CN;
Xiaochun Song, Hubei, CN;
Gongtian Shen, Beijing, CN;
Wei Zhao, Beijing, CN;
Junming Lin, Fujian, CN;
Yihua Kang, Hubei, CN;
Yu Zhang, Beijing, CN;
Shen Wang, Beijing, CN;
HUBEI UNIVERSITY OF TECHNOLOGY, Wuhan, Hubei, CN;
TSINGHUA UNIVERSITY, Beijing, CN;
CHINA SPECIAL EQUIPMENT INSPECTION AND RESEARCH INSTITUTE, Beijing, CN;
EDDYSUN (XIAMEN) ELECTRONIC CO., LTD., Xiamen, Fujian, CN;
HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY, Wuhan, Hubei, CN;
Abstract
A method for detecting a defect of a metal plate includes selecting N controllable emitting electromagnetic acoustic transducers EMATs as excitation transducers, and selecting M omnidirectionally receiving EMATs as receiving transducers, exciting an ultrasonic guided wave in a metal plate by a ncontrollable emitting EMAT with a predetermined emission angle; determining whether each of M1 omnidirectionally receiving EMATs and the ncontrollable emitting EMAT form a scattering group; for the scattering group, solving a position of a scattering point and a direction of a scattering side according to a distance between Tand R, the emission angle and a travel time of the ultrasonic guided wave; performing a curve fitting on all the scattering points in directions of respective scattering sides to obtain a contour image of the defect.