The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2020
Filed:
Nov. 02, 2015
Mitsubishi Electric Corporation, Chiyoda-ku, Tokyo, JP;
MITSUBISHI ELECTRIC CORPORATION, Chiyoda-Ku, Tokyo, JP;
Abstract
A detection apparatus improves abnormality detection accuracy after start of an inspection operation while reducing the amount of work that is done before the start of the operation. The apparatus includes an object characteristic storage device that stores a parameter indicating a characteristic of an abnormal object, an object detection unit that detects an abnormal object candidate from image information by using the parameter, an object storage unit that stores the abnormal object candidate, an object display unit that displays the abnormal object candidate stored in the object storage unit, a calibration input unit that receives input of calibration information on the abnormal object candidate, and, based on the calibration information, corrects the abnormal object candidate stored in the object storage unit, and an object characteristic calibration unit that calibrates the parameter stored in the object characteristic storage device, based on the calibration information received by the calibration input unit.