The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2020

Filed:

Mar. 21, 2018
Applicant:

Espec Corp., Kita-ku, Osaka-shi, Osaka, JP;

Inventors:

Norihiro Yoshida, Kobe, JP;

Hideo Sawano, Neyagawa, JP;

Shuji Tabuchi, Kobe, JP;

Yoshinori Sadakata, Sanda, JP;

Assignee:

Espec Corp., Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/32 (2006.01); G01N 17/00 (2006.01); G01N 25/58 (2006.01); G01M 99/00 (2011.01); G01N 25/00 (2006.01);
U.S. Cl.
CPC ...
G01N 17/002 (2013.01); G01M 99/002 (2013.01); G01N 25/00 (2013.01);
Abstract

An object of the invention is to provide an environmental test apparatus which can directly set an environmental change rate and hardly causes input errors. Change amount information associated with a total change amount and change rate information associated with a change amount per unit time can be input. A target locus of change can be set by using a change amount/change rate setting method of setting the target locus of change based on a combination of change amount information and change rate information. When setting the target locus of change by the change amount/change rate setting method, input of time information is inhibited.


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