The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2020
Filed:
May. 05, 2015
Applicant:
The Regents of the University of California, Oakland, CA (US);
Inventors:
Paul S. Weiss, Los Angeles, CA (US);
Anne M. Andrews, Los Angeles, CA (US);
Andrea L. Bertozzi, Santa Monica, CA (US);
Stanley J. Osher, Pacific Palisades, CA (US);
Assignee:
The Regents of the University of California, Oakland, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 3/22 (2006.01); E21B 47/10 (2012.01); G01N 15/00 (2006.01); G01N 15/06 (2006.01); G01N 15/08 (2006.01); G01N 15/14 (2006.01);
U.S. Cl.
CPC ...
G01N 15/0806 (2013.01); E21B 47/1015 (2013.01); G01M 3/226 (2013.01); G01N 15/06 (2013.01); G01N 15/1463 (2013.01); G01N 15/08 (2013.01); G01N 2015/0038 (2013.01); G01N 2015/0693 (2013.01); G01N 2015/1486 (2013.01);
Abstract
Systems and methods of fabricating and functionality patterned nanowire probes that are stable under fluid reservoir conditions and have imageable contrast are provided. Optical imaging and deconstruction methods and systems are also provided that are capable of determining the distribution of nanowires of a particular pattern to determine the mixing between or leakage from fluid reservoirs.