The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2020

Filed:

Sep. 19, 2018
Applicant:

Bae Systems Information and Electronic Systems Integration Inc., Nashua, NH (US);

Inventors:

Andrew N. Acker, Honolulu, HI (US);

Michael J. DeWeert, Kaneohe, HI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 4/04 (2006.01); G01V 3/12 (2006.01); G01N 21/21 (2006.01);
U.S. Cl.
CPC ...
G01J 4/04 (2013.01); G01N 21/211 (2013.01); G01V 3/12 (2013.01); G01N 2021/217 (2013.01);
Abstract

An object detection system uses a change in a linear polarization statistic between a first image at a first time and a second image at a second time to determine the presence or the likelihood of an object beneath a surface. The presence of the object may be determined by regions of anomalously high changes in the polarization statistic. The system may use a polarization change detection detector which may simultaneously capture images in multiple polarization channels. Further, the polarization change detection detector may be coupled with a laser interferometry system.


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