The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2020
Filed:
Sep. 17, 2015
Endress+hauser Gmbh+co. KG, Maulburg, DE;
Thomas Sulzer, Basel, CH;
Peter Seefeld, Bad Wimpfen, DE;
Ulrich Kaiser, Basel, CH;
Sergej Lopatin, Lörrach, DE;
Christof Huber, Bern, CH;
Peter Klöfer, Steinen, DE;
Mike Touzin, Höllstein, DE;
Endress+Hauser SE+Co. KG, Maulburg, DE;
Abstract
Apparatus for determining and/or monitoring at least one physical or chemical process variable of a medium in a containment comprising at least one sensor element, at least one housing module and at least one flange, wherein the sensor element and the flange are connected with the housing module, wherein the flange in a first portion, which is at least partially media contacting, is manufactured at least partially of a first material, which is selected application specifically, and wherein the flange in a second portion, which is at least partially environment contacting, is manufactured at least partially of a synthetic material.