The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2020

Filed:

Oct. 05, 2012
Applicants:

Massachusetts Institute of Technology, Cambridge, MA (US);

The Broad Institute, Inc., Cambridge, MA (US);

Dana-farber Cancer Institute, Inc., Boston, MA (US);

Inventors:

Justin Lamb, Cambridge, MA (US);

Todd R. Golub, Newton, MA (US);

Aravind Subramanian, Cambridge, MA (US);

David D. Peck, Framingham, MA (US);

Assignees:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/6837 (2018.01); G16B 25/00 (2019.01); G16B 40/00 (2019.01); C12Q 1/6809 (2018.01);
U.S. Cl.
CPC ...
C12Q 1/6837 (2013.01); C12Q 1/6809 (2013.01); G16B 25/00 (2019.02); G16B 40/00 (2019.02);
Abstract

The present invention provides compositions and methods for making and using a transcriptome-wide gene-expression profiling platform that measures the expression levels of only a select subset of the total number of transcripts. Because gene expression is believed to be highly correlated, direct measurement of a small number (for example, 1,000) of appropriately-selected transcripts allows the expression levels of the remainder to be inferred. The present invention, therefore, has the potential to reduce the cost and increase the throughput of full-transcriptome gene-expression profiling relative to the well-known conventional approaches that require all transcripts to be measured.


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