The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2020

Filed:

Dec. 26, 2014
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Hiroko Tada, Tokyo, JP;

Hideyuki Noda, Tokyo, JP;

Hideki Niimi, Toyama, JP;

Isao Kitajima, Toyama, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/00 (2006.01); C12Q 1/18 (2006.01); C12M 1/34 (2006.01); C12Q 1/66 (2006.01);
U.S. Cl.
CPC ...
C12Q 1/18 (2013.01); C12M 1/34 (2013.01); C12Q 1/008 (2013.01); C12Q 1/66 (2013.01);
Abstract

When bacteria growth is determined in the related art using an ATP method, the bacteria growth is determined, based on an increase or a decrease in live bacteria ATP with the lapse of a culture time. Accordingly, it is necessary to measure the live bacteria ATP multiple times while antimicrobial susceptibility culture is carried out. It takes time and labor in sample preparation for each measurement, and it is difficult to quickly obtain an antimicrobial susceptibility result. Therefore, according to the present invention, the presence or absence of antimicrobial susceptibility of bacteria is determined, based on an ATP luminescence amount derived from dead bacteria in a culture liquid.


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