The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2020
Filed:
Aug. 24, 2018
Applicant:
Toto Ltd., Kitakyushu-Shi, Fukuoka, JP;
Inventors:
Hiroaki Ashizawa, Kitakyushu, JP;
Masakatsu Kiyohara, Kitakyushu, JP;
Assignee:
Toto Ltd., Fukuoka, JP;
Primary Examiner:
Int. Cl.
CPC ...
C04B 35/553 (2006.01); H01J 37/32 (2006.01); C04B 35/515 (2006.01); C04B 41/87 (2006.01); C04B 41/50 (2006.01); C04B 41/00 (2006.01);
U.S. Cl.
CPC ...
C04B 35/5156 (2013.01); C04B 35/553 (2013.01); C04B 41/009 (2013.01); C04B 41/5055 (2013.01); C04B 41/87 (2013.01); H01J 37/32495 (2013.01); C04B 2235/3225 (2013.01); C04B 2235/445 (2013.01); C04B 2235/76 (2013.01); C04B 2235/781 (2013.01); C04B 2235/963 (2013.01);
Abstract
A structure includes a polycrystalline substance of yttrium fluoride, wherein an average crystallite size in the polycrystalline substance is less than 100 nanometers. When taking a peak intensity detected near diffraction angle 2θ=24.3° by X-ray diffraction as α, and taking a peak intensity detected near diffraction angle 2θ=25.7° as β, a peak intensity ratio α/β of the structure is not less than 0% and less than 100%.