The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2020
Filed:
Jan. 25, 2018
Raylytic Gmbh, Leipzig, DE;
Frank Thilo Trautwein, Filderstadt, DE;
Marcel Dreischarf, Leipzig, DE;
Raylitic GmbH, Leipzig, DE;
Abstract
A method for measuring an X-ray image of an area undergoing medical examination that has at least one object. A 3D model is provided of the area undergoing examination that includes a virtual 3D object to be assigned to the object to be measured, a digitally reconstructed X-ray picture is computed based on the 3D model and under the assumption of a virtual projection direction, the X-ray image is compared with the digitally reconstructed X-ray picture, the virtual projection direction is changed relative to the virtual 3D object. The steps of comparing and changing are repeated until a virtual projection direction with maximum correlation between the X-ray image and the digitally reconstructed X-ray picture is found. An object plane is determined that is to be assigned to the virtual 3D object. A corrected projection direction is defined and the X-ray image is measured.