The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2020

Filed:

Mar. 06, 2019
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventors:

Masaaki Takizawa, Kanagawa, JP;

Tsuneo Kasai, Nagano, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/38 (2006.01); H04N 1/387 (2006.01); H04N 1/192 (2006.01); H04N 1/401 (2006.01); H04N 1/193 (2006.01);
U.S. Cl.
CPC ...
H04N 1/3876 (2013.01); H04N 1/192 (2013.01); H04N 1/1933 (2013.01); H04N 1/3878 (2013.01); H04N 1/401 (2013.01); H04N 2201/0094 (2013.01);
Abstract

An image reading apparatus includes a first sensor that reads a first area of an image, a second sensor that reads a second area, and a processing circuit that generates a merge image by performing a merge process on first image data acquired by reading by the first sensor and second image data acquired by reading by the second sensor. The processing circuit calculates a correction value having a tendency of approaching zero as being away from an overlap area between the first area and the second area based on a reading result acquired by reading the overlap area by the first sensor and a reading result acquired by reading by the second sensor, and generates the merge image by performing an offset process using the correction value.


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