The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2020
Filed:
Jul. 23, 2018
Applicant:
Vmware, Inc., Palo Alto, CA (US);
Inventors:
Assignee:
VMware, Inc., Palo Alto, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 29/06 (2006.01); H04L 29/08 (2006.01); H04L 12/743 (2013.01); H04L 12/26 (2006.01); H04L 12/24 (2006.01);
U.S. Cl.
CPC ...
H04L 67/104 (2013.01); H04L 41/0893 (2013.01); H04L 43/08 (2013.01); H04L 43/106 (2013.01); H04L 45/7453 (2013.01); H04L 67/1097 (2013.01);
Abstract
In an embodiment, a method for monitoring elements of a distributed computing system is disclosed. In the embodiment, the method involves evaluating a metric event from a monitored element based on at least one of tags and conditions of the monitored element by applying declared group functions corresponding to declared groups over the metric event and at least one of admitting the monitored element into membership of a declared group, evicting the monitored element from membership of a declared group, and maintaining membership of the monitored element in a declared group based on the evaluation of the metric event.