The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2020

Filed:

Aug. 19, 2016
Applicant:

Accenture Global Solutions Limited, Dublin, IE;

Inventors:

Ketaki Deshpande, Gurgaon, IN;

Muthumari Shanmugasundaram, Bangalore, IN;

Ruchika Sachdeva, Delhi, IN;

Laura Chittick, London, GB;

Youssef D. Tuma, London, GB;

Jonathan Saginaw, New York, NY (US);

Juhi Munjal, Delhi, IN;

Michael Baldino, III, Centennial, CO (US);

Jonathan Stribley, Ann Arbor, MI (US);

Kaushik Sanyal, Bangalore, IN;

Arnab D. Chakraborty, Bangalore, IN;

Deepthi Adimulam, Hyderabad, IN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 29/06 (2006.01); H04L 12/24 (2006.01); G06N 20/00 (2019.01); H04N 21/442 (2011.01); H04L 29/08 (2006.01); H04N 21/25 (2011.01); H04N 21/258 (2011.01); H04N 21/24 (2011.01); H04N 21/658 (2011.01);
U.S. Cl.
CPC ...
H04L 65/601 (2013.01); G06N 20/00 (2019.01); H04L 41/142 (2013.01); H04L 41/145 (2013.01); H04L 41/16 (2013.01); H04L 67/10 (2013.01); H04L 67/14 (2013.01); H04N 21/2407 (2013.01); H04N 21/252 (2013.01); H04N 21/25866 (2013.01); H04N 21/44222 (2013.01); H04N 21/6582 (2013.01);
Abstract

A device may communicate with a group of devices to obtain data regarding a set of events occurring for the group of devices. The device may process the data regarding the set of events to remove a subset of data entries, from the data, that is associated with an anomalous event. A first layer of analysis may relate to the group of devices, a second layer of analysis relating to a set of sessions of operating a user interface via the group of devices, and a third layer of analysis relating to information provided via the user interface. The device may perform the multiple layers of analysis via a machine learning technique to identify an alteration relating to the information provided via the user interface. The device may alter the information provided via the user interface based on performing the multiple layers of analysis.


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