The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2020

Filed:

Apr. 30, 2019
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Sriram Murali, Bengaluru, IN;

Jaiganesh Balakrishnan, Bengaluru, IN;

Chandrasekhar Sriram, Chennai, IN;

Sashidharan Venkatraman, Bengaluru, IN;

Jagdish Kumar Agrawal, Bengaluru, IN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/06 (2006.01); H03H 17/02 (2006.01); H03M 1/00 (2006.01);
U.S. Cl.
CPC ...
H03M 1/0626 (2013.01); H03H 17/0227 (2013.01); H03M 1/004 (2013.01);
Abstract

Multi-Nyquist differentiator circuits and a radio frequency sampling receiver that applies a multi-Nyquist differentiator circuit. A multi-Nyquist differentiator includes a fixed coefficient filter, a scaling circuit, and a summation circuit. The fixed coefficient filter is configured to filter digital samples generated by an ADC. The scaling circuit is coupled to an output of the fixed coefficient filter, and is configured to scale output of the fixed coefficient filter based on a selected Nyquist band. The summation circuit is coupled to the scaling circuit, and is configured to generate a derivative of the digital samples based on output of the scaling circuit.


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