The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2020

Filed:

Feb. 10, 2017
Applicant:

Altera Corporation, San Jose, CA (US);

Inventors:

Vaughan Betz, Toronto, CA;

Shuze Zhao, Toronto, CA;

Ibrahim Ahmed Ibrahim, Toronto, CA;

Olivier Trescases, Toronto, CA;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03K 19/173 (2006.01); H03K 19/17764 (2020.01); H03K 19/17784 (2020.01); H03K 19/17736 (2020.01); H03K 19/17728 (2020.01);
U.S. Cl.
CPC ...
H03K 19/17764 (2013.01); H03K 19/17784 (2013.01); H03K 19/1774 (2013.01); H03K 19/17728 (2013.01);
Abstract

Methods and systems for operating a programmable logic fabric () including a dynamic parameter scaling controller () that tracks an operating parameter that functions at multiple operating conditions by maintaining the operating parameter while cycling through multiple operating conditions during a calibration mode using the calibration configuration for the programmable logic fabric (). The dynamic parameter scaling controller () also stores one or more functional values for the operating parameter in a calibration table. The dynamic parameter scaling controller () also operates the programmable logic fabric () using a design configuration using dynamic values for the operating parameter based at least in part on the one or more operating conditions.


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