The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2020
Filed:
Sep. 25, 2017
National Technology & Engineering Solutions of Sandia, Llc, Albuquerque, NM (US);
Hung Loui, Albuquerque, NM (US);
National Technology & Engineering Solutions of Sandia, LLC, Albuquerque, NM (US);
Abstract
Technologies pertaining to the calibration of ultra-wide-band active-electronically-scanned arrays to compensate for transmit and receive mutual coupling between array elements and/or non-ideal isolated channels are described herein. A plurality of near-field measurements are taken by way of probe or probes that may be moved among a plurality of positions aligned with respective elements in the array. For each position of the probe, each of the elements of the array is stimulated to transmit or receive a calibration signal to or from the probe, respectively. Frequency-domain transfer functions are computed from the received signals by the probe or the element for each of the array elements in each of the positions of the probe. The inverse of the matrix of transfer functions comprise frequency-domain transmit and receive correction factors that are used to modify desired array inputs/outputs such that the modified signals correct for mutual coupling between elements in the array.