The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2020

Filed:

Jan. 23, 2019
Applicant:

Toyota Jidosha Kabushiki Kaisha, Toyota-shi, Aichi-ken, JP;

Inventor:

Keisuke Kimura, Nagoya, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/10 (2006.01); H01L 29/32 (2006.01); H01L 29/739 (2006.01); H01L 27/07 (2006.01); H01L 29/861 (2006.01); H01L 29/66 (2006.01); H01L 29/40 (2006.01);
U.S. Cl.
CPC ...
H01L 29/861 (2013.01); H01L 27/0727 (2013.01); H01L 29/1095 (2013.01); H01L 29/32 (2013.01); H01L 29/66136 (2013.01); H01L 29/66348 (2013.01); H01L 29/7397 (2013.01); H01L 29/407 (2013.01);
Abstract

The semiconductor substrate may include an emitter region, an upper body region being in direct contact with the gate insulating film below the emitter region, an intermediate region being in direct contact with the gate insulating film below the upper body region, a lower body region being in direct contact with the gate insulating film below the intermediate region, a drift region being in direct contact with the gate insulating film below the lower body region, and a collector region being in direct contact with the drift region from below. The lower body region may include a first range and a second range that has a higher crystal defect density than the first range. The second range may be in direct contact with the gate insulating film. The first range may be in direct contact with the second range on a side opposed to the gate insulating film.


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