The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2020
Filed:
Aug. 01, 2018
Memory controller, information processing system, and nonvolatile-memory defect determination method
Applicant:
Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;
Inventor:
Masazumi Maeda, Yokohama, JP;
Assignee:
FUJITSU LIMITED, Kawasaki, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/04 (2006.01); G11C 16/34 (2006.01); G11C 16/32 (2006.01); G11C 16/10 (2006.01); G11C 29/50 (2006.01); G11C 29/00 (2006.01);
U.S. Cl.
CPC ...
G11C 16/3495 (2013.01); G11C 16/10 (2013.01); G11C 16/32 (2013.01); G11C 16/349 (2013.01); G11C 29/50012 (2013.01); G11C 29/50016 (2013.01); G11C 29/70 (2013.01);
Abstract
A memory controller includes a memory that stores therein data corresponding to a distribution of write durations measured from a nonvolatile memory device of a specific model, and a processor that measures a write duration taken to write data to a memory cell in a nonvolatile memory device of a same model as the specific model and that determines whether or not the memory cell is defective by evaluating, based on the data corresponding to the distribution, a displacement of the measured write duration from a center portion of the distribution.