The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2020
Filed:
Jun. 21, 2018
Honeywell International Inc., Morris Plains, NJ (US);
Adrian Matias Fuxman, North Vancouver, CA;
Greg Stewart, North Vancouver, CA;
Honeywell International Inc., Morris Plains, NJ (US);
Abstract
A method of tuning alarm parameters for condition monitoring of processing equipment in an industrial processing facility (IPF). For a selected process variable a first histogram is displayed from stored historical process data. An initial process alarm threshold is overlayed on the first histogram, and ON-time delay alarms are computed using an initial zero ON-time delay that would have occurred. A second histogram displays a distribution of alarms run length from alarm event data with the zero ON-time delay. Alarm tuning adjusts the initial process alarm threshold and/or the initial time delay, and an alarm performance is then evaluated from viewing the first and second histogram or viewing a hybrid display providing a time series plot including alarm event and process data, and the adjusting is repeated until the evaluating is deemed satisfactory. The new alarm tuning values are implemented to a control system of the IPF.