The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2020

Filed:

Jan. 25, 2018
Applicant:

Daqri, Llc, Los Angeles, CA (US);

Inventor:

Nalin Senthamil, Santa Clara, CA (US);

Assignee:

DAQRI, LLC, Los Angeles, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/80 (2017.01); G06T 7/33 (2017.01); G06T 19/00 (2011.01); G06N 20/00 (2019.01); G06F 16/29 (2019.01); G06F 16/583 (2019.01); G06T 7/73 (2017.01); G06T 7/246 (2017.01); G06N 3/08 (2006.01); G06N 3/04 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/337 (2017.01); G06F 16/29 (2019.01); G06F 16/583 (2019.01); G06K 9/00664 (2013.01); G06N 3/04 (2013.01); G06N 3/08 (2013.01); G06N 20/00 (2019.01); G06T 7/246 (2017.01); G06T 7/75 (2017.01); G06T 7/80 (2017.01); G06T 19/006 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/30244 (2013.01);
Abstract

An image localization system is described. A server stores a localization model that associates location and orientation data with each picture among a plurality of pictures. The server receives a query for a location and an orientation of a device. The query includes a first picture. A second picture that matches the first picture is identified. The server determines the location and the orientation of the device based on the location and orientation data corresponding to the second picture. The location and orientation data indicates position, orientation, three-dimensional geometry, gyroscope measurement, and accelerometer measurement.


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