The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2020
Filed:
May. 31, 2018
Ricoh Company, Ltd., Tokyo, JP;
Shuhei Watanabe, Chiba, JP;
Takuroh Sone, Kanagawa, JP;
Hideyuki Kihara, Kanagawa, JP;
Takayuki Gotoh, Kanagawa, JP;
Takashi Soma, Kanagawa, JP;
Akihiro Iwamatsu, Ibaraki, JP;
RICOH COMPANY, LTD., Tokyo, JP;
Abstract
An evaluation device includes a projector to project a pattern having an edge component onto an object, an imaging device to capture an image of the object, a reflective-property correction unit to correct an amount of change in shape of a virtual image of the pattern reflected in the object, using reflective-property data of a surface of the object, and an evaluation-value calculator to evaluate image clarity of the surface of the object based on the corrected amount of change. A computer-readable non-transitory recording medium storing a program for causing a computer to execute a method. The method includes correcting an amount of change in shape of a virtual image of the pattern reflected in the object based on image data that is obtained by capturing an object onto which a pattern having an edge component is projected, using reflective-property data of a surface of the object.