The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2020

Filed:

Jan. 25, 2018
Applicant:

Adobe Inc., San Jose, CA (US);

Inventors:

Peter Merrill, Sunnyvale, CA (US);

Gregg Darryl Wilensky, San Francisco, CA (US);

Assignee:

Adobe Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/66 (2006.01); G06N 3/08 (2006.01); G06T 11/60 (2006.01); G06K 9/62 (2006.01); G06N 3/04 (2006.01);
U.S. Cl.
CPC ...
G06K 9/66 (2013.01); G06K 9/6202 (2013.01); G06N 3/0454 (2013.01); G06N 3/08 (2013.01); G06N 3/084 (2013.01); G06T 11/60 (2013.01); G06N 3/0445 (2013.01);
Abstract

Methods and systems are provided for identifying parameter image adjustments. In embodiments, a set of candidate parameter values associated with a parameter to be analyzed in association with an image is identified. Subsequently, the image is rendered in accordance with each candidate parameter value to generate a set of rendered images. A neural network can then be used to identify a parameter image adjustment to apply to the image based on features associated with the set of rendered images. The neural network can be trained based on a comparison of the identified parameter image adjustment and a reference parameter value associated with the parameter being analyzed.


Find Patent Forward Citations

Loading…